DEFECT RECOGNITION AND IMAGE PROCESSING IN III-V COMPOUNDS
Language: English Series: Materials Science MonographsPublication details: Amsterdam Elsevier 1985Description: xii,306pSubject(s): DDC classification:- 621.38152 In8d
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 In8d (Browse shelf(Opens below)) | Link to resource | Available | A95971 |
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| 621.38152 IN8A ULTRAFAST PHENOMENA IN SEMICONDUCTORS | 621.38152 IN8A AMORPHOUS AND MICROCRYSTALLINE SEMICONDUCTORS | 621.38152 IN8A AMORPHOUS AND MICROCRYSTALLINE SEMICONDUCTORS | 621.38152 In8d DEFECT RECOGNITION AND IMAGE PROCESSING IN III-V COMPOUNDS | 621.38152 In8d DEFECT CONTROL IN SEMICONDUCTORS | 621.38152 IN8D V.2 DEFECT CONTROL IN SEMICONDUCTORS | 621.38152 IN8G GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY |
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