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TESTING AND DIAGNOSIS OF VLSI AND ULSI
Publication details: Dordrecht Kluwer Academic Pub. c1988Description: viii,533ISBN:- 902473794X
- 621.38173 N214t
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38173 N214t (Browse shelf(Opens below)) | Link to resource | Available | A105345 |
Total holds: 0
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| 621.38173 N213p PROCESS AND DEVICE SIMULATION FOR MOS-VLSI CIRCUITS | 621.38173 N214c COMPUTER DESIGN AIDS FOR VLSI CIRCUITS | 621.38173 N214D DESIGN SYSTEMS FOR VLSI CIRCUITS | 621.38173 N214t TESTING AND DIAGNOSIS OF VLSI AND ULSI | 621.38173 N435a ACITVE INTEGRATED CIRCUIT SYNTHESIS | 621.38173 N435a ACITVE INTEGRATED CIRCUIT SYNTHESIS | 621.38173 N818a ANALOG ELECTRONIC CIRCUITS |
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