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WAFER SCALE INTEGRATION
Publication details: Ieee Computer Society Press, Los Alamitos 1991Description: xiv,342ISBN:- 0818691263
- 621.38152 IN8
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 IN8 (Browse shelf(Opens below)) | Link to resource | Damaged (F) | A124766 |
Total holds: 0
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| 621.38152 IM7F IMPURITY DIFFUSION AND GETTERING IN SILICON | 621.38152 In8 INTRODUCTION TO SEMICONDUCTOR TECHNOLOGY | 621.38152 In8 ION IMPLANTATION IN SEMICONDUCTORS | 621.38152 IN8 WAFER SCALE INTEGRATION | 621.38152 IN8 BEAM INJECTION ASESSMENT OF DEFECTS IN SEMICONDUCTORS | 621.38152 IN82 GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY, GADEST 2003 | 621.38152 In8a APPLICATIONS OF ION BEAMS TO MATERIALS |
Includes Bibliographical References And Index
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