SILICON CARBIDE AND RELATED MATERIALS - 2002; ECSCRM 2002
Publication details: Trans Tech Publications Ltd, Switzerland 2002Description: xxvii,1006ISBN:- 0878499202
- 621.38152 IN8SI
Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|---|
![]() |
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 IN8SI (Browse shelf(Opens below)) | Link to resource | Available | A140820 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur shelves, Collection: COMPACT STORAGE (BASEMENT) Close shelf browser (Hides shelf browser)
No cover image available |
![]() |
![]() |
![]() |
No cover image available |
![]() |
![]() |
||
621.38152 In8re RADIATION EFFECTS IN SEMICONDUCTORS 1976 | 621.38152 IN8S SILICON MATERIALS SCIENCE AND TECHNOLOGY | 621.38152 IN8S SILICON MATERIALS SCIENCE AND TECHNOLOGY | 621.38152 IN8SI SILICON CARBIDE AND RELATED MATERIALS - 2002; ECSCRM 2002 | 621.38152 IN8SI SILICON CARBIDE AND RELATED MATERIALS 2001 | 621.38152 IN8SI SILICON CARBIDE AND RELATED MATERIALS - 2002; ECSCRM 2002 | 621.38152 J641r Reliability and radiation effects in compound semiconductors |
There are no comments on this title.
Log in to your account to post a comment.