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GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY, GADEST 2003
Series: Solid State Phenomena, Part B Of"Diffusion And Defect Data" ; Publication details: Scitec Publications Ltd., Switzerland 2004Description: xvi,682ISBN:- 3908450829
- 621.38152 IN82
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 IN82 (Browse shelf(Opens below)) | Link to resource | Available | A151260 |
Total holds: 0
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| 621.38152 In8 ION IMPLANTATION IN SEMICONDUCTORS | 621.38152 IN8 WAFER SCALE INTEGRATION | 621.38152 IN8 BEAM INJECTION ASESSMENT OF DEFECTS IN SEMICONDUCTORS | 621.38152 IN82 GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY, GADEST 2003 | 621.38152 In8a APPLICATIONS OF ION BEAMS TO MATERIALS | 621.38152 IN8A ULTRAFAST PHENOMENA IN SEMICONDUCTORS | 621.38152 IN8A AMORPHOUS AND MICROCRYSTALLINE SEMICONDUCTORS |
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