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Phenomeenes critiques, systemes aleatoires, theories de jauge : Critical phenomena, random systems, gauge theories

Contributor(s): Material type: TextTextLanguage: English Publication details: Amsterdam North Holland 1986Description: xxxvii, 537pISBN:
  • 0444869808
Subject(s): DDC classification:
  • 530.143 C869
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Holdings
Item type Current library Collection Call number URL Status Date due Barcode Item holds
Books Books PK Kelkar Library, IIT Kanpur COMPACT STORAGE (BASEMENT) 530.143 C869 (Browse shelf(Opens below)) Link to resource Available A96024
Total holds: 0

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