VLSI design and test

Contributor(s):

Gaur, Manoj Singh [ed.]

Material type: Text

TextLanguage: English Series: Communications in computer and information science / edited by Simone Diniz Junqueira Barbosa | no. 382Publication details: Berlin Springer 2013Description: xi, 388pISBN:

9783642420238

Subject(s):

Integrated circuits -- Very large scale integration -- Design and construction

DDC classification:

004 V849

Summary: This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

List(s) this item appears in: New Arrival Oct 08 to 14, 2018

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Item type	Current library	Collection	Call number	Status	Date due	Barcode	Item holds
Books	PK Kelkar Library, IIT Kanpur	General Stacks	004 V849 (Browse shelf(Opens below))	Available		GB1262

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Previous	004 T63a Applied computer science	004 T722 Trends in computational social choice	004 T847s The second self computers and the human spirit	004 V849 VLSI design and test	004 V887i Introduction to circuit complexity a uniform approach	004 W151t2 The TAO of computing [2nd ed.]	004 W67e Explorations in quantum computing	Next

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

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VLSI design and test

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