TY  - BOOK
AU  - Glazov, V. M.
AU  - Vigdorovich, V. N.
TI  - MICROHARDNESS OF METALS AND SEMICONDUCTORS
U1  - 620.1126 
PY  - 1971///
CY  - N. Y.
PB  - Consultants Bureau
KW  - Hardness
KW  - Metals -- Testing
KW  - Semiconductors -- Testing
N1  - Ref. : P. 216-226
ER  -