TY  - BOOK
AU  - Tolansky, Samuel
TI  - MICROSTRUCTURES OF SURFACES, USING INTERFEROMETRY
SN  - 713131799
U1  - 535.4 
PY  - 1968///
CY  - N. Y.
PB  - American Elsevier Pub. Co.
KW  - Interferrometer
KW  - Surfaces (Technology)
ER  -