TY  - BOOK
AU  - Feldman, Leonard C.
AU  - Mayer, James W [ed.]
TI  - Fundamentals of surface and thin film analysis
SN  - 0444009892
U1  - 530.41 
PY  - 1986///
CY  - New York
PB  - North-Holland
KW  - Surfaces (Technology) -- Analysis
ER  -