TY  - BOOK
AU  - Lannoo, M.
AU  - Bourgoin, J.
TI  - POINT DEFECTS IN SEMICONDUCTORS
U1  - 537.622 
PY  - 1981///
CY  - Berlin
PB  - Springer-Verlag
KW  - Point defects
KW  - Semiconductors -- Defects
N1  - Contents:  v. 1. Theoretical aspects. -- v. 2. experimental Aspects
ER  -