TY - BOOK AU - Lannoo, M. AU - Bourgoin, J. TI - POINT DEFECTS IN SEMICONDUCTORS U1 - 537.622 PY - 1981/// CY - Berlin PB - Springer-Verlag KW - Point defects KW - Semiconductors -- Defects N1 - Contents: v. 1. Theoretical aspects. -- v. 2. experimental Aspects ER -