TY  - BOOK
AU  - Ahuja, Narehdra
AU  - Schachter, Bruce J.
TI  - PATTERN MODELS
U1  - 001.434 
PY  - 1983///
CY  - New York
PB  - John Wiley
KW  - Pattern Recognition Systems
KW  - Geometrical Models
KW  - Image Processing
ER  -