TY  - BOOK
AU  - Tsui, Frank F.
TI  - LSI/VLSI TESTABILITY DESIGN
U1  - 621.38173 
PY  - 1987///
CY  - New York
PB  - Mcgraw-Hill
KW  - Integrated Circuits -- Large Scale Integration -- Testing
KW  - Integrated Circuits -- Very Large Scale Integration -- Testing
ER  -