TY  - BOOK
AU  - Jha, Niraj K.
AU  - Kundu, Sandip
TI  - TESTING AND RELIABLE DESING OF CMOS CIRCUITS
SN  - 07923390563
U1  - 621.39732 
PY  - 1990///
CY  - Boston
PB  - Kluwer Academic Pub.
KW  - Metal Oxide Semiconductors, Complementary -- Testing
KW  - Metal Oxide Semiconductros, Complementary -- Raliability
KW  - Integrated Circuits -- Very Large Scale Integration
ER  -