TY  - BOOK
AU  - Rajpal S. Sirohi
AU  - Sirohi,Rajpal S.
TI  - SPECKLE METROLOGY
SN  - 0824789326
U1  - 620.1127 
PY  - 1993///
CY  - 
PB  - Marcel Dekker, New York
KW  - Non-Destructive Testing
KW  - Speckle Metrology
ER  -