TY  - BOOK
AU  - Jimenez, J., [ed.]
TI  - DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS AND DEVICES
SN  - 0750302941
U1  - 541.377 
PY  - 1994///
CY  - Bristol
PB  - Institute Of Physics
KW  - Semiconductors -- Cong
KW  - Semiconductor Devices -- Cong
N1  - Proc. Of The Fifth International Conference, Spain, 1993
ER  -