TY  - BOOK
AU  - Heijden,Ferdin
AU  - Vande
TI  - IMAGE BASED MEASUREMENT SYSTEMS
SN  - 0471950629
U1  - 621.367 
PY  - 1994///
CY  - 
PB  - John Wiley, Chichester
KW  - Pattern Recognition
N1  - Includes Index
ER  -