TY  - BOOK
AU  - Schroder, Dieter K.
TI  - Semiconductor material and device characterization
SN  - 0471511048
U1  - 621.38152 
PY  - 1990///
CY  - New York
PB  - John Wiley
KW  - Semiconductors
KW  - Semiconductors -- Testing
ER  -