TY  - BOOK
AU  - David,Rene
TI  - RANDOM TESTING OF DIGITAL CIRCUITS
SN  - 0824701828
U1  - 621.3815 
PY  - 1998///
CY  - 
PB  - Marcel Dekker, New York
KW  - Digital Integrated Circuits - Testing
N1  - Includes Bibliographical References And Index
ER  -