TY - BOOK AU - Kuo,Way, Chien,Wei-Ting Kary AU - Kim,Taeho TI - RELIABILITY, YIELD, AND STRESS BURN-IN SN - 0792381076 U1 - 621.381 PY - 1998/// CY - PB - Kluwer Academic Publishers,Boston KW - Integrated Circuits--Design And Construction KW - Microelectronics--Reliability KW - Computer Software--Development ER -