TY  - BOOK
AU  - Kuo,Way, Chien,Wei-Ting Kary
AU  - Kim,Taeho
TI  - RELIABILITY, YIELD, AND STRESS BURN-IN
SN  - 0792381076
U1  - 621.381 
PY  - 1998///
CY  - 
PB  - Kluwer Academic Publishers,Boston
KW  - Integrated Circuits--Design And Construction
KW  - Microelectronics--Reliability
KW  - Computer Software--Development
ER  -