TY  - BOOK
AU  - R P Agarwala
AU  - Agarwala,R P
TI  - SPECIAL DEFECTS IN SEMICONDUCTING MATERIALS
SN  - 3908450446
U1  - 620.112972 
PY  - 2000///
CY  - 
PB  - Scitec Publications, Zuerich
KW  - Semiconductors -- Defects
ER  -