TY  - BOOK
AU  - Leblebici,Yusuf
AU  - Kang,Sung-Mo (Steve)
TI  - HOT-CARRIER RELIABILITY OF MOS VLSI CIRCUITS
SN  - 079239352X
U1  - 621.395 
PY  - 1993///
CY  - 
PB  - Kluwer Academic Publishers, Boston
KW  - Integrated Circuits -- Very Large Scale Integration -- Defects -- Mathematical Models
KW  - Metal Oxide Semiconductors -- Reliability -- Mathematical Models
KW  - Hot-Carriers -- Reliability -- Mathematical Models
ER  -