TY  - BOOK
AU  - Orlando, Auciello, Alan R Krauss
AU  - Krauss,Alan R
TI  - IN SITU REAL - TIME CHARACTERIZATION OF THIN FILMS
SN  - 0471241415
U1  - 530.4275 
PY  - 2001///
PB  - John Wiley, New York
KW  - Thin Films
ER  -