TY  - BOOK
AU  - Alford,Terry L
AU  - Feldman, Leonard C.
AU  - Mayer, James W.
TI  - FUNDAMENTALS OF NANOSCALE FILM ANALYSIS
SN  - 9780387292601
U1  - 530.4275 
PY  - 2007///
CY  - New York
PB  - Springer Science+Business Media Inc.
KW  - Thin Films
KW  - Nanostructured Materials
ER  -