FUNDAMENTALS OF POWDER DIFFRACTION AND STRUCTURAL CHARACTERIZATION OF MATERIALS - Pecharsky,Vitalij K.; Zavalij,Peter Y. (Kluwer Academic Publishers, Boston, 2003)
Includes Bibliographical References And Index
Includes Cd-Rom
Keywords: X-Rays -- Diffraction -- Measurement; Powders -- Optical Properties -- Measurement; X-Ray Crystallography