TY  - BOOK
AU  - Brandon,David
AU  - Kaplan,Wayne D
TI  - MICROSTRUCTURAL CHARACTERIZATION OF MATERIALS
SN  - 0471985023
U1  - 620.11299 
PY  - 2001///
CY  - 
PB  - John Wiley, Chichester
KW  - Materials -- Microscopy
KW  - Microstructure
ER  -