TY  - BOOK
AU  - Nicolici,Nicola
AU  - Al-Hashimi,Bashir M
TI  - POWER-CONSTRAINED TESTING OF VLSI CIRCUITS
SN  - 140207235X
U1  - 621.3950287 
PY  - 2003///
CY  - 
PB  - Kluwer Academic Publishers, Boston
KW  - Integrated Circuits, Very Large Scale Integration -- Testing
KW  - Semiconductors -- Thermal Properties
ER  -