TY  - BOOK
AU  - Chang,Shih-Lin
TI  - X-RAY MULTIPLE-WAVE DIFFRACTION
SN  - 3540211969
U1  - 548.83 
PY  - 2004///
CY  - 
PB  - Springer-Verlag, Berlin
KW  - X-Ray Crystallography
KW  - X-Rays -- Diffraction
ER  -