TY  - BOOK
AU  - Kaupp,G.
TI  - ATOMIC FORCE MICROSCOPY, SCANNING NEARFIELD OPTICAL MICROSCOPY AND NANOSCRATCHING
SN  - 3540284052
U1  - 502.82 
PY  - 2006///
CY  - 
PB  - Springer-Verlag, Berlin
KW  - Atomic Force Microscopy
ER  -