DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS - Sachdev,Manoj,Gyvez,Jose Pineda De; Agarwal,Vishwani D. (Springer,Aa Dordrecht, 2007)
Keywords: Metaloxide Semiconductors, Complementary -- Testing; Metaloxide Semiconductors, Complementary -- Defects; Integrated Circuits -- Very Largescale Integration -- Testing