TY  - BOOK
AU  - Sachdev,Manoj,Gyvez,Jose Pineda De
AU  - Agarwal,Vishwani D.
TI  - DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS
SN  - 9780387465463
U1  - 621.3815 
PY  - 2007///
CY  - 
PB  - Springer,Aa Dordrecht
KW  - Metaloxide Semiconductors, Complementary -- Testing
KW  - Metaloxide Semiconductors, Complementary -- Defects
KW  - Integrated Circuits -- Very Largescale Integration -- Testing
ER  -