TY  - BOOK
AU  - Brandon, David 
AU  - Kaplan, Wayne d.
TI  - Microstructural characterization of materials [2nd ed.]
SN  - 9780470027844
U1  - 620.11299 
PY  - 2008///
CY  - Chichester
PB  - John Wiley & Sons
KW  - Materials -- Microscopy
ER  -