621.381  / D361 <br/>
<br/>
       Defects in microelectronic materials and devices 
 / edited by Daniel M. Fleetwood, Sokrates T. Pantelides and Ronald D. Schrimpf 
 .- Boca Raton: Crc Press,  2009 
 .- xvi, 753p . 
<br><u>ISBN:</u> 9781420043761 
<br/><u>Subject Headings:</u> <br/>Microelectronics - Materials - Testing;
<br/><br/><label>Subjects--Geographic Terms: </label><br/>Integrated circuits - Defects
<br/><U>Author Added Entry: </u><br/>Fleetwood, Daniel M., Ed.;
<br><U>Copy Details:</u><br> Acc. No.: <b>A165011</b>, Full Call No.: 621.381 D361,   Item type:  Books , Location: General Stacks, <br><b>------------------------- --------------------- ------ --------- ------- ------- --------- -------- </b><br>