TY  - BOOK
AU  - Pavlov, Andrei
AU  - Sachdev, Manoj
TI  - CMOS SRAM circuit design and parametric test in nano-scaled technologies: process-aware SRAM design and test
SN  - 9781402083624
U1  - 621.38152 
PY  - 2008///
CY  - New York
PB  - Springer
KW  - Metaloxide semiconductors, complementary
ER  -