621.38150287 / T286
Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach
/ edited by Yichuang Sun
.- London: The Institution Of Engineering And Technology, 2008
.- xx, 389p .
.- ( Circuits, Devices And Systems Series No. 19
ISBN: 9780863417450
Subject Headings:
Linear integrated circuits -- Testing;
Author Added Entry:
Sun,Yichuang, Ed;
Copy Details:
Acc. No.: A166155, Full Call No.: 621.38150287 T286, Item type: Books , Location: COMPACT STORAGE (BASEMENT),
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