TY  - BOOK
AU  - 
AU  - Sun,Yichuang, Ed
TI  - Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach
SN  - 9780863417450
U1  - 621.38150287 
PY  - 2008///
CY  - London
PB  - The Institution Of Engineering And Technology
KW  - Linear integrated circuits -- Testing
ER  -