TY  - BOOK
AU  - Ker, Ming-Dou
AU  - Hsu, Sheng-Fu
TI  - Transient-induced latchup in CMOS integrated circuits
SN  - 9780470824078
U1  - 621.395 
PY  - 2009///
CY  - Singapore
PB  - John Wiley & Sons
KW  - Metal oxide semiconductors, complimentary defects
ER  -