TY  - BOOK
AU  - 
AU  - Hakim, Edward B., Ed.
TI  - Microelectronic reliability
SN  - 0890062846
U1  - 621.38152 
PY  - 1989///
CY  - Norwood
PB  - Artech House
KW  - Semiconductors--Reliability
N1  - Contents: Vol.1 - Reliability, test and diagnostics
ER  -