TY  - BOOK
AU  - Breitenstein, O.
AU  - Warta, W.
TI  - Lock-in thermography: basics and use for evaluating electronic devices and materials
SN  - 9783642024160
U1  - 621.381548 
PY  - 2003///
CY  - Berlin
PB  - Springer
KW  - Electronic apparatus and applications -- Thermal properties
ER  -