502.825 / K299
Kelvin probe force microscopy : measuring and compensating electrostatic forces
/ edited by Sascha Sadewasser and Thilo Glatzel
.- Berlin: Springer, 2012
.- xiv, 331p. .
.- ( Springer series in surface sciences
** edited By G. Ertl )
ISBN: 9783642225659
Subject Headings:
Atomic force microscopy;
Author Added Entry:
Sadewasser, Sascha, ed.;
Glatzel, Thilo, ed.;
Copy Details:
Acc. No.: A173557, Full Call No.: 502.825 K299, Item type: Books , Location: General Stacks,
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