TY  - BOOK
AU  - Sadewasser, Sascha, ed.
AU  - Glatzel, Thilo, ed.
TI  - Kelvin probe force microscopy: measuring and compensating electrostatic forces
T2  - edited By G. Ertl
SN  - 9783642225659
U1  - 502.825 
PY  - 2012///
CY  - Berlin
PB  - Springer
KW  - Atomic force microscopy
ER  -