TY  - BOOK
AU  - 
AU  - Haight, Richard, Ed.
TI  - Handbook of instrumentation and techniques for semiconductor nanostructure characterization [2 v.]
SN  - 9789814322805
U1  - 620.5 
PY  - 2012///
CY  - New Jersey
PB  - World Scientific
KW  - Semiconductor
KW  - optical properties
KW  - Nanostructure materials -- Optical properties
KW  - Semiconductors -- Optical properties
ER  -