TY  - BOOK
AU  - Tehranipoor, Mohammad
AU  - Peng, Ke
TI  - Test and diagnosis for small-delay defects
SN  - 9781441982964
U1  - 621.381548 
PY  - 2011///
CY  - New York
PB  - Springer
KW  - Integrated circuits--Fault tolerance
KW  - Integrated circuits--Testing
KW  - Delay faults (Semiconductors)
KW  - Integrated circuits--Very large scale integration--Defects
KW  - Integrated circuits--Very large scale integration--Testing
KW  - Engineering
KW  - Operating systems (Computers)
KW  - Systems engineering
ER  -