TY  - BOOK
AU  - Tehranipoor, Mohammad 
AU  - Ahmed, Nisar
TI  - Nanometer technology designs high-quality delay tests
SN  - 9780387764863
U1  - 621.381548 
PY  - 2008///
CY  - New York
PB  - Springer
KW  - Nanotechnology
KW  - Integrated circuits--Testing
KW  - Integrated circuits--Very large scale integration
KW  - Computer engineeringComputer-aided design
KW  - Systems engineering
ER  -