TY  - BOOK
AU  - Fewster, Paul F.
TI  - X ray scattering from semiconductors and other materials
SN  - 9789814436922
U1  - 537.535 
PY  - 2015///
CY  - New Jersey
PB  - World Scientific
KW  - X-Ray -- Scattering
KW  - Semiconductors
ER  -