TY  - BOOK
AU  - Krishnaiah,M V,Asuvathraman,R
AU  - Parthasarathi,R
TI  - MICRO-CONTROLLER BASED SEMI-AUTOMATIC DATA ACQUISITION SYSTEM FOR THE SIEMENS D500 X-RAY DIFFRACTOMETER
U1  - GOI-DAE 
PY  - 2003///
CY  - 
PB  - Indira Gandhi Centre For Atomic Research, Kalpakkam
KW  - Automation
KW  - X-Ray Diffraction
ER  -