TY  - GEN
AU  - Goldberg, M. F.
AU  - 
AU  - Vaccaro, Joseph
AU  - 
TI  - PHYSICS OF FAILURE IN ELECTRONICS
U1  - 621.381 
PY  - 1963///
CY  - Baltimore
PB  - Spartan Books
KW  - Electronic Apparatus And Appliances -- Reliability -- Congresses
N1  - Sponsored By The Applied Research Laboratory Of Rome Air Development Center And The Armour Research Foundation Of Illinois Institute Of Technology
ER  -