TY  - GEN
AU  - Pickles, William L. [ed.]
AU  - Barrett, Charles S. [ed.]
AU  - Newkirk, John B. [ed.]
AU  - Ruud, Clayton O. [ed.]
ED  - Annual Conference On Applications Of X-Ray Analysis
TI  - Advances in x-ray analysis: proceedings..
U1  - 543.085 
PY  - 1974///
CY  - New York
PB  - Plenum Press
KW  - X-Ray-Industrial Applications -- Congs
N1  - Conference Sponsored By University Of Denver, Denver Research Institute
ER  -