TY  - GEN
AU  - Fillard, J. P [ed.]
TI  - DEFECT RECOGNITION AND IMAGE PROCESSING IN III-V COMPOUNDS
U1  - 621.38152 
PY  - 1985///
CY  - Amsterdam
PB  - Elsevier
KW  - Semiconductors -- Defects -- Cong
KW  - Image Processing -- Cong
KW  - Gallium Arsenide -- Cong
ER  -