TY  - GEN
AU  - Von Bardelben, H. J.
TI  - PROCEEDINGS..
U1  - 620.112972 
PY  - 1986///
CY  - Switzerland
PB  - Trans. Tech. Pub.
KW  - Semiconductors -- Cong
N1  - Contents : V. 1. Defects In Semiconductors I -- V. 2. Defects Of Semiconductors Ii -- V. 3.Defects In Semiconductors Iii
ER  -